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Meadowlark Optics - Wave Plates 6/24 LB 2024
Photonics Marketplace
11 products

Microscopy

Clear All Filters xmetrology systems xMicroscopy x
SpectrÄ: Spectrally Controlled Interferometry
SpectrÄ: Spectrally Controlled Interferometry
Apre Instruments
  • Category: Microscopy / Other Microscopy Products
  • Type: Other
S-Series Interferometer
S-Series Interferometer
Apre Instruments
  • Category: Microscopy / Other Microscopy Products
  • Type: Other
  • Distortion: <0.1%
  • Fringe Resolution: 650 fringe/aperture
  • Image Resolution (100 mm): 100 µm
Contour Elite I
Contour Elite I
Bruker Nano Surfaces
  • Category: Microscopy / Microscope Systems
  • Type: Optical
  • Magnification: 115X
  • Max Scan: 73 μm / sec
  • Max Scan Range: ≤10mm
  • Sample Height: Up to 100 mm (4 in.)
Dektak XTL
Dektak XTL
Bruker Nano Surfaces
  • Category: Microscopy / Microscope Systems
  • Type: Optical
  • Stylus Force: 0.03 mg to 15 mg
  • Vertical Range: 1 mm
  • Vertical Resolution: 1Å max. (@6.55 µm range)
Contour Elite K
Contour Elite K
Bruker Nano Surfaces
  • Category: Microscopy / Microscope Systems
  • Type: Optical
  • Magnification: 115X
  • Max Scan: 47 μm/sec
  • Max Scan Range: >10 mm
  • Sample Height: Up to 100 mm
S wide
S wide
Sensofar Metrology
  • Category: Microscopy / Microscope Systems
  • Type: Optical
  • Spectral Range: VIS
  • Display Resolution: 0.001 µm
  • Max. Extended Measuring area: 300 × 300 mm
  • Vertical Measuring Range: 40 mm
S neox Five Axis
S neox Five Axis
Sensofar Metrology
  • Category: Microscopy / Microscope Systems
  • Type: Optical
  • Spectral Range: VIS
S neox
S neox
Sensofar Metrology
  • Category: Microscopy / Microscope Systems
  • Type: Optical
  • Spectral Range: VIS
S mart
S mart
Sensofar Metrology
  • Category: Microscopy / Microscope Systems
  • Type: Optical
  • Spectral Range: VIS
TopMap In.Line 3D Optical Profiler
TopMap In.Line 3D Optical Profiler
Polytec Inc.
  • Category: Microscopy / Other Microscopy Products
  • Type: Other
Active Cantilever Scanning Microscope
Active Cantilever Scanning Microscope
Seiwa Optical America Inc.
  • Category: Microscopy / Microscope Systems
  • Type: Scanning Probe
Microscopy Products

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