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Photonics Handbook

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Measuring Aspheres: Selecting the Best TechniqueMeasuring Aspheres: Selecting the Best Technique
Amy Frantz, Edmund Optics Inc.
The benefits of aspheric lenses are numerous: They allow for a reduction in spherical aberrations and are ideal for focusing or collimating light, as they can achieve a low ƒ-number. Aspheres...
Nanopositioning: A Step AheadNanopositioning: A Step Ahead
Scott Jordan, Brian Lula, and Stefan Vorndran, PI (Physik Instrumente) LP
By its original definition, a nanopositioning device is a mechanism capable of repeatedly delivering motion in increments as small as one nanometer. Lately demands from industry and research have...
Aspheric Lenses: Optimizing the DesignAspheric Lenses: Optimizing the Design
Jeremy Govier, Edmund Optics Inc.
With the understanding of aspheric lens manufacturing provided in part one of this article, designers have the tools to optimize their aspheres; the next step is to understand how to specify and...
Flat Optics: Considerations When BuyingFlat Optics: Considerations When Buying
Michael Naselaris, Sydor Optics Inc.
Flat optics generally perform three main functions: They transmit light (windows), reflect light (mirrors), and fold light (prisms). While most optical manufacturers make spherical and flat optics, a...
Thin-Film Coatings: A Buyers' GuideThin-Film Coatings: A Buyers' Guide
Trey Turner and Roger Kirschner, Research Electro-Optics Inc. (REO)
What are thin-film coatings? The purpose of any optical thin-film coating is to modify the transmittance and reflectance properties of the substrate material to which they are applied. Most coatings...
Positioning System Performance: Understanding the RulesPositioning System Performance: Understanding the Rules
MKS/Newport
Abbe Error — Linear off-axis errors introduced by angular deviations coupled to a moment arm at the point of interest on stage mounted devices (θ in Figure 1). The effect of Abbe error...
Broadband Spectrophotometry: A Fast, Simple, Accurate ToolBroadband Spectrophotometry: A Fast, Simple, Accurate Tool
Iris Bloomer, n&k Technology, Inc.; Rebecca Mirsky, Al Shugart International
Designing devices that incorporate ultrathin films is an important means of enhancing yields. However, characterizing ultrathin films provides a challenge for mainstream metrology tools such as...
Imaging Colorimetry: Accuracy in Display and Light Source MetrologyImaging Colorimetry: Accuracy in Display and Light Source Metrology
Ron Rykowski and Hubert Kostal, Radiant Imaging, Inc.
The market for flat panel displays (FPDs) has undergone tremendous growth, driven mostly by increased demand for televisions, cell phones, computers, digital cameras and MP3 players. Similarly,...
Dynamic Interferometry: Getting Rid of the JittersDynamic Interferometry: Getting Rid of the Jitters
John Hayes and James Millerd, 4D Technology Corporation
Conditions on the factory floor and in industrial cleanrooms with high-capacity air filtration systems can hamper the use of interferometry. Another problem is the testing of large-aperture mirrors...
Polarization Mode Dispersion: Concepts and MeasurementPolarization Mode Dispersion: Concepts and Measurement
Paul Hernday, Fiber Optic Measurement Training and Consulting
There are three fundamentally different dispersive phenomena in optical fiber, of which polarization mode dispersion (PMD) is the most complex. In digital multimode fiber systems, a light pulse...
Photonics Handbook

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