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Test & Measurement Articles

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Scatter and BSDF Measurements: Theory and PracticeScatter and BSDF Measurements: Theory and Practice
Richard Pfisterer, Photon Engineering LLC
Except for direct illumination from the sun, laser, or other light source, everything we see or detect is ultimately scattered light. Light can be scattered or rescattered during its propagation to...
Measuring Surface Roughness: The Benefits of Laser Confocal MicroscopyMeasuring Surface Roughness: The Benefits of Laser Confocal Microscopy
ROBERT BELLINGER, Evident
When evaluating the surface of a component, surface roughness can be assessed by eye or by rubbing it with a fingertip. Common expressions include “shiny,” “lusterless and...
Laser Measurement Systems: Best PracticesLaser Measurement Systems: Best Practices
JOHN MCCAULEY, MKS Ophir
Given the pace at which technology advances, there always seems to be a learning curve. With the abundance of consumer electronics available, there typically is no right or wrong way to use these...
Interferometry: Measuring with LightInterferometry: Measuring with Light
Zygo Corporation
An interferometer is an instrument that compares the position or surface structure of two objects. The basic two-beam division of amplitude interferometer components consists of a light source, a...
Spectroscopy: The Tools of the TradeSpectroscopy: The Tools of the Trade
Dr. John R. Gilchrist, Clyde HSI
All optical spectrometry techniques rely on the measurement of radiant power. The configuration of the instrument varies based on the measurement technique: absorption, emission, luminescence, or...
Laser Beam Measurement: Slit-Based Profilers for Pulsed BeamsLaser Beam Measurement: Slit-Based Profilers for Pulsed Beams
Allen M. Cary, Photon Inc.
Measuring pulsed-beam lasers has generally required the use of a CCD array profiler. This is a reasonable solution for low-power lasers in the UV and visible wavelength range, but these require...
Dynamic Interferometry: Getting Rid of the JittersDynamic Interferometry: Getting Rid of the Jitters
John Hayes and James Millerd, 4D Technology Corporation
Conditions on the factory floor and in industrial cleanrooms with high-capacity air filtration systems can hamper the use of interferometry. Another problem is the testing of large-aperture mirrors...
Particle Image Velocimetry: Basics, Developments and TechniquesParticle Image Velocimetry: Basics, Developments and Techniques
M. Kelnberger, InnoLas GmbH; G. Schwitzgebel, Universität Mainz
Particle image velocimetry (PIV) is an experimental tool in fluid mechanics and aerodynamics. The basic principle involves photographic recording of the motion of microscopic particles that follow...
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