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DataRay Inc. - ISO 11146-Compliant Laser Beam Profilers
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Scatter and BSDF Measurements: Theory and PracticeScatter and BSDF Measurements: Theory and Practice
Richard Pfisterer, Photon Engineering LLC
Except for direct illumination from the sun, laser, or other light source, everything we see or detect is ultimately scattered light. Light can be scattered or rescattered during its propagation to...
Interferometry: Measuring with LightInterferometry: Measuring with Light
Zygo Corporation
An interferometer is an instrument that compares the position or surface structure of two objects. The basic two-beam division of amplitude interferometer components consists of a light source, a...
Broadband Spectrophotometry: A Fast, Simple, Accurate ToolBroadband Spectrophotometry: A Fast, Simple, Accurate Tool
Iris Bloomer, n&k Technology, Inc.; Rebecca Mirsky, Al Shugart International
Designing devices that incorporate ultrathin films is an important means of enhancing yields. However, characterizing ultrathin films provides a challenge for mainstream metrology tools such as...
Dynamic Interferometry: Getting Rid of the JittersDynamic Interferometry: Getting Rid of the Jitters
John Hayes and James Millerd, 4D Technology Corporation
Conditions on the factory floor and in industrial cleanrooms with high-capacity air filtration systems can hamper the use of interferometry. Another problem is the testing of large-aperture mirrors...
Particle Image Velocimetry: Basics, Developments and TechniquesParticle Image Velocimetry: Basics, Developments and Techniques
M. Kelnberger, InnoLas GmbH; G. Schwitzgebel, Universität Mainz
Particle image velocimetry (PIV) is an experimental tool in fluid mechanics and aerodynamics. The basic principle involves photographic recording of the motion of microscopic particles that follow...
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