Products by Category

< All CategoriesMicroscopyMicroscope SystemsOther Microscopy Products

Sheetak - Cooling at your Fingertip 5/24 MR

Teledyne DALSA - Line Scan Leader 5/24 HP

26 products

Microscopy

Clear All Filters x form x Microscopy x

S-Series Interferometer
Apre Instruments

Type: Other
Distortion: <0.1%
Fringe Resolution: 650 fringe/aperture
Image Resolution (100 mm): 100 µm

pE-400 Series
CoolLED Ltd.

Type: Light Sources
Application: Routine to advanced fluorescence
Control: Manual, USB, TTL
Individual LED control: pE-400max

pE-340fura
CoolLED Ltd.

Type: Light Sources
Application: Fura-2 Calcium Imaging
Channels: 3
Control Options: Pod, Software, Digital

Modular Infinity Microscope (MIM) System
Applied Scientific Instrumentation Inc.

Type: Optical
Beamsplitter: Olympus AX/BX/IX series
Camera Port: C, T, F and ENG Mounts
Tube Lens: Nikon, 100, 120, 300 mm

Spero® QCL-IR Microscope
DRS Daylight Solutions Inc.

Type: Optical
Spectral Range: MWIR
Image Acquisition Time: < 40 s for image cube
Imaging Modes: Transmission and Reflection
Spectral Resolution: Variable, down to 2 cm-1

MultiMode 8-HR
Bruker Nano Surfaces

Type: Scanning Probe
Imaging Noise Level: <30 pm rms
Maximum Sample Size: 15 mm dia × 5 mm thick

Dimension FastScan
Bruker Nano Surfaces

Type: Scanning Probe
Integral Nonlinearity XYZ: <0.50%
X-Y Scan Range: 90 μm × 90 μm typical
Z Range: 10 μm typical in imaging

Dimension Edge
Bruker Nano Surfaces

Type: Scanning Probe
X-Y Scan Range: 85 μm minimum
Z Range: 9.5 μm minimum

DektakXT
Bruker Nano Surfaces

Type: Optical
Data Points Per Scan: 120,000 max.
Stylus Force: 1 to 15 mg with LIS 3 sensor
Vertical Range: 1 mm

Dektak XTL
Bruker Nano Surfaces

Type: Optical
Stylus Force: 0.03 mg to 15 mg
Vertical Range: 1 mm
Vertical Resolution: 1Å max. (@6.55 µm range)

Dimension Icon
Bruker Nano Surfaces

Type: Scanning Probe
Integral nonlinearity XYZ: <0.5% typical
X-Y scan range: 90 μm x 90 μm typical
Z range: 10 μm typical in imaging

FusionScope Correlative Microscope Platform
Quantum Design Inc.

Type: Electron
Scan Range XY: 22 × 22 μm
Scan Range Z: 15 μm

Tungsten Filament Scanning Electron Microscope SEM3200
CIQTEK

Type: Electron
Acceleration Voltage: 0.2 kV-30 kV
Extension: SE\BSE\EDS\EDX\EBSD, etc.
Low Vacuum Mode: 3 nm @ 30 kV (SE)

Modular Microspectroscopy System
HORIBA

Type: Other

Flow Imaging Microscopes
Amerigo Scientific

Type: Other

S neox
Sensofar Metrology

Type: Optical
Spectral Range: VIS

TopMap Micro.View+ 3D Optical Profiler
Polytec Inc.

Type: Other

KeyLight™ 4-channel Fluorescent Microscopy Light Source
Phoseon Technology Inc.

Type: Light Sources

KeyLight™ 5-channel Fluorescent Microscopy Light Source
Phoseon Technology Inc.

Type: Light Sources

KeyLight Illumination Source for Fluorescent Microscopy (7-channel)
Phoseon Technology Inc.

Type: Light Sources

TopMap In.Line 3D Optical Profiler
Polytec Inc.

Type: Other

TopMap Micro.View 3D Optical Profiler
Polytec Inc.

Type: Other

MSA-600 Micro System Analyzer
Polytec Inc.

Type: Other

NanoScan OP400
Prior Scientific Instruments Ltd.

Type: Other
Travel Range - closed loop: 400µ
Travel Range - open loop: 480µ

TM-505B/1005B Series 176-Toolmaker's Microscopes
Mitutoyo America Corp.

Type: Optical
Magnification: 30X
Spectral Range: VIS

Alba STED
ISS Inc.

Type: Optical
Magnification: 100X
Dwell Time: ≥ 2 µs
lLser: pulsed
Resolution: ≤ 50 nm

Microscopy Products

We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.