Request InfoSemiProbe Inc.Iris, a macro wafer defect inspection system launched by SemiProbe, is for use by microelectronic device manufacturers. It detects contamination, processes damage and flaws in the circuit pattern, and is suitable for use with microelectromechanical systems, optical components, double-sided devices and photovoltaics. It detects visual defects as small as 3 µm, including probe marks, ink dots, residual films, through silicon vias, bumps, incomplete etches, scratches, cracks and chips, passivation and large-scale contamination. When a defect is identified, its failure code is noted on the wafer...See full productRelated content from Photonics MediaPRODUCTSVision-Spectra.com June 2022 IssueFluorescence Imaging SolutionThe Fluorescence Imaging Solution from TPL Vision UK is a multi-UV dome device, bringing safety and flexibility to UV fluorescence imaging applications. 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