Request InfoApre InstrumentsSpectrally Controlled Interferometry (SCI). Measure only the surface of interest without confusing multiple surface interference that prohibits measurement. SCI electronically controls the coherence for a fast setup in the “laser” mode, then isolates the surface you want to measure in the “white light” mode all the way down to 150-µm optical thickness. Contact us today, or visit www.apre-inst.com.See full productRelated content from Photonics MediaPRODUCTSPromoted Content December 2022 IssueShort Cycle Times in Alignment TurningThe ATS alignment turning stations from TRIOPTICS combine the proven OptiCentric® centration technology with a highly precise turning machine. The new ATS-C model was recently presented at the...Photonics Spectra February 2024 IssueIndustrial UV-C LEDThe PearlAqua Kilo from AquiSense Technologies is a UV-C LED meant for industrial applications. 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