Request InfoAnritsu Corp., Test & MeasurementONNA, Japan, Feb. 9, 2018 — Anritsu Corp. has introduced clock recovery, PAM4 analysis and jitter analysis options for its BERTWave MP2110A sampling oscilloscope tp help shorten inspection times, increase production-line yields and lower measurement equipment costs in 200/400-G high-speed optical module and device manufacturing environments. With the options installed, the BERTWave MP2110A can be used to evaluate physical layer performance of CFP2/4/8, QSFP28, SFP28, OSFP and QSFP-DD optical modules, active optical cables and optical devices. The new options augment the existing bit error rate measurement and EYE...See full productRelated content from Photonics MediaPRODUCTSPhotonics Spectra January 2024 IssueCompact PhotorelayThe TLP3476S photorelay in the S-VSON4T package from Toshiba Electronic Devices & Storage Corp. offers a high-speed turn-on time, helping to shorten test time for semiconductor testers. 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