Invisible Turns Visible: SWIR Cameras
SVS-Vistek GmbHRequest Info
The semiconductor industry's increasing demands for quality and quantity require high-end machine vision systems. To meet these needs, SVS-Vistek enables reliable subsurface inspection of wafers with high detail due to high-resolution SWIR cameras. This is particularly important as traditional visible light inspection can only detect surface defects, whereas SWIR cameras can observe through silicon, allowing for the detection of subsurface defects.
The key features of SVS Vistek’s SWIR cameras include:
- High-resolution imaging with up to 5.2 megapixels with precise sensor alignment
- High-performance interface options, including CXP-12 and 10 GigE, for stable and fast data transfer
- Easy installation and standardized interfaces for reduced time to market
- Advanced image optimization algorithms and optional thermo-electric cooling (TEC) for excellent image quality
Problem Solving and Applications
SVS Vistek’s SWIR cameras solve the problem of reliably detecting smallest subsurface defects in bare, bonded, and diced wafers as well as packaged ICs, which is crucial for ensuring the quality and reliability of semiconductor components.
Model Variety
The SWIR camera family from SVS-Vistek covers a broad range of models with different technical features in terms of resolution and speed for various tasks. The latest SVS-Vistek SWIR cameras, the fxo992 and fxo993, feature high-resolution Sony IMX992 and IMX993 InGaAs sensors, allowing for unprecedented detection of smallest defects in semiconductor inspection applications.
This innovation is noteworthy as it meets the growing demands for both quality and quantity in the semiconductor industry, offering a reliable and efficient solution for subsurface defect detection. With its high-resolution imaging and advanced features, SVS Vistek’s SWIR camera is well positioned to make a significant impact in the industry.
https://www.svs-vistek.com/lp/swir-wafer-inspection/
/Buyers_Guide/SVS-Vistek_GmbH/c14402
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