Request InfoJEOL USA Inc.JEOL USA Inc. has unveiled an atomic resolution scanning transmission electron microscope (STEM). The 200-kV aberration-corrected JEM-ARM200F analytical microscope achieves high-angle annular dark-field resolution of 0.08 nm. It enables atom-by-atom imaging resolution and high spatial resolution for atom-to-atom chemical mapping of materials. The shielding design protects the ultrahigh-power optics from airflow, vibration and acoustical interference, and additional shielding protects against electronic interference, magnetic fields and thermal fluctuations.See full productRelated content from Photonics MediaPRODUCTSPhotonics Spectra January 2023 IssueMicroscopy SoftwareThe Enersight software platform from Leica Microsystems is designed for microscope inspection and quality control. 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