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ContourX-500 Profilometer

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Bruker Nano Surfaces
As the world’s most comprehensive automated benchtop system for fast, noncontact 3D surface metrology, the gage-capable ContourX-500 boasts unmatched Z-axis resolution and accuracy. This white-light interferometry (WLI) profiler is easily customized for the widest range of complex applications, from QA/QC metrology of precision machined surfaces and semiconductor processes to R&D characterization for ophthalmic and MEMS devices.See full product

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