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Field Emission Scanning Electron Microscope

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JEOL USA Inc.
PEABODY, Mass., Sept. 18, 2020 — The JSM-IT700HR InTouchScope field emission scanning electronic microscope from JEOL is a compact system that offers ultra-high resolution and versatile analytical capabilities. The JSM-IT700HR InTouchScope FE SEM is equipped with a large specimen chamber and both high- and low-vacuum modes for managing a wide variety of specimen types in their native state. It can be outfitted with a fully-embedded energy dispersive x-ray spectroscopy microanalysis system providing live analysis during image observation. An electron gun with a spatial resolution of 1 nm and the ability to deliver...See full product

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