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Grazing Incidence Spectrometer

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McPHERSON
McPherson Inc.’s grazing incidence spectrometer Model 248/310 enables users to make direct optical measurements from 1 to 300 nm, to test soft XUV high-energy light sources (plasma or laser) and samples and to measure lifetime, persistence and decay with continuous spectral scanning. A normal scan with a diode or channel-electron multiplier-equipped instrument takes about 20 min. Users can resolve, clearly discern, record and store spectra and spectral events in the 1- to 300-nm scanning range. A new “up” scanning feature combines the 789A-3 digital drive and 248/310...See full product

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