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Veeco Instruments Products
MOCVD System
PLAINVIEW, N.Y., March 9, 2016 — Veeco Instruments Inc. has announced the TurboDisc K475i arsenic phosphide, metal organic chemical vapor deposition (MOCVD) system for the production of red, orange and yellow LEDs, as well as multijunction III-V solar cells, laser diodes and transistors. The system reduces LED cost per wafer by up to 20 percent compared to alternative systems. It also incorporates TurboDisc MOCVD technology. FlowFlange technology produces films with very high uniformity and improved within-wafer...
Veeco Instruments Inc.
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Optical Profilers
Aug 1, 2010 — Veeco Instruments Inc. has unveiled the ContourGT Surface Metrology product family, its 10th generation of noncontact, 3-D optical surface profilers. Based on proprietary white-light interferometry technology, the devices feature patented higher...
Veeco Instruments Inc.
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AFM System
Jun 7, 2010 — Veeco Instruments Inc. has unveiled the Dimension Edge atomic force microscope (AFM) system for physical and life sciences applications. It features hardware and software advances that reduce the time required to produce expert-level data, providing...
Veeco Instruments Inc.
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Surface Metrology System
Apr 12, 2010 — The NT9080, a surface metrology system introduced by Veeco Instruments Inc., uses white-light interferometry to measure surface topography nondestructively, from nanometer-scale roughness through millimeter-scale steps, with subnanometer vertical...
Veeco Instruments Inc.
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Scanning Probe Microscope
Feb 28, 2010 — The MultiMode 8 scanning probe microscope launched by Veeco Instruments Inc. employs two proprietary and patent-pending technologies, ScanAsyst and PeakForce QNM. The former has an automated imaging optimization mode that provides access to advanced...
Veeco Instruments Inc.
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NT9080 Surface Metrology System
PLAINVIEW, N.Y., Feb. 2, 2010 – The NT9080 surface metrology system has been introduced by Veeco Instruments Inc. It uses white light interferometry to measure critical surface topography nondestructively, from nanometer-scale roughness through millimeter-scale steps, with...
Veeco Instruments Inc.
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Confocal Metrology Systems
PLAINVIEW, N.Y., May 28, 2009 – Veeco Instruments Inc. has launched the Veeco Confocal Metrology (VCM) optical profiler systems that are compact and easy-to-use noncontact solutions for characterization of steep slopes greater than 60°, measurement of layers beneath transmissive...
Veeco Instruments Inc.
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Life Sciences AFM
PLAINVIEW, N.Y., March 16, 2009 – Veeco Instruments has announced the release of its BioScope Catalyst life science atomic force microscope (AFM), which integrates atomic force and light microscopy. The system features hardware and software innovations that facilitate combined use...
Veeco Instruments Inc.
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Atomic Force Microscope
PLAINVIEW, N.Y., Feb. 10, 2009 – Veeco Instruments Inc. has released its Dimension Icon atomic force microscope (AFM). Building upon a large-sample platform, the microscope delivers high resolution, ease-of-use and fast time-to-results. It is designed to address the needs of both...
Veeco Instruments Inc.
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(9 results found)
April 2024
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