Helios NanoLab 660 DualBeam
HILLSBORO, Ore., July 2, 2013 — FEI’s Helios NanoLab 660 DualBeam system provides scanning electron microscopy imaging in combination with focused ion beam milling for materials science research.
Applications include investigating the structure and function of materials at the nanoscale, creating prototypes of micro- and nanoelectromechanical systems, and preparing ultrathin samples for atomic-scale imaging and analysis in a transmission electron microscope.
The device uses proprietary electron optical and...
FEI Life Sciences (acquired by Thermo Fisher)