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Optics Products
Dichroic Short-Pass Filters
Aug 1, 2011 — Edmund Optics’ TechSpec dichroic short-pass filters have broad transmission and reflection ranges and a sharp cutoff wavelength. Suitable for use as spectral beamsplitters, they are designed for a 45° angle of incidence. Light rejected by the filters is reflected at 90°, making them suitable for use in fluorescence applications. They feature low polarization dependence, offer broad spectral ranges and are made with a precision fused silica substrate. The filters are available in...
Edmund Optics Inc.
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Fiber Optic Borescopes
Aug 1, 2011 — Gradient Lens Corp.’s Hawkeye Pro MicroFlex fiber optic borescopes enable manufacturers of small machined or molded medical parts and components to inspect for burrs, surface finish and defects inside very small components. At 0.5, 0.9 and 1.5...
Gradient Lens Corp.
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Measuring Microscope
Aug 1, 2011 — Titan Tool Supply Inc. has introduced the XAM-1, a measuring microscope with a dovetail slide and digital micrometer for precision measurements and recording. The micrometer shows readings in 0.001-mm divisions. The microscope provides precision...
Titan Tool Supply Inc.
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Microscopy Software
Aug 1, 2011 — Olympus Europa Holding GmbH has unveiled the FV10-ASW 3.0 version of its software for the FluoView FV1000 confocal laser scanning microscopes and Fluoview FV1000MPE multiphoton excitation systems. By incorporating high-dynamic-range imaging, a...
Olympus Europa SE & Co. KG
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Off-Axis Parabolas
Aug 1, 2011 — Rapid prototyping specialist Optimax Systems Inc. offers lightweight off-axis parabolas made from hard ceramic materials. They are free of print-through errors because of newly adopted ultrasonic brittle-material machining combined with proven...
Optimax Systems Inc.
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Lenses for SWIR Sensors
CHESHAM, England, July 28, 2011 — In response to increasing demand for off-the-shelf optics optimized for short-wavelength infrared (SWIR) performance, Resolve Optics Ltd. has designed two fixed-focus lenses (25 and 50 mm) specifically for the 0.9- to 1.7-μm waveband. In...
Resolve Optics Ltd.
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Variable-Bandwidth Filter
BIRKERØD, Denmark, July 28, 2011 — The SuperK Varia manufactured by NKT Photonics A/S is a computer-controlled variable-bandwidth filter that effectively turns a supercontinuum white light source into a powerful single-line laser. Designed for use with the company’s range of...
NKT Photonics A/S
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Olympus Stream 6.1 Software
HAMBURG, Germany, July 27, 2011 — Olympus Europa Holding GmbH has introduced its Olympus Stream software for optimizing industrial analysis using a microscope. Built-in instant extended focal imaging (EFI) and manual multiple image alignment (MIA) functions expand the range of...
Olympus Europa SE & Co. KG
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BXiS Industrial Microscope
CENTER VALLEY, Pa., July 25, 2011 — Olympus has introduced the BXiS, a microscope system that streamlines industrial inspection and measurement workflows while providing accurate, actionable data with just a few clicks. The ergonomic industrial system offers flexibly integrated...
Evident
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Blue Laser Diode Wavelengths
LITTLE ROCK, Ark., July 21, 2011 — Power Technology Inc. has announced the availability of new blue laser diode wavelengths and power levels for 2011. The laser diodes can be installed in a wide assortment of the company’s modules created to address the needs of high-end...
Power Technology Inc.
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Infrared OD 4 Bandpass Filters
BARRINGTON, N.J., July 21, 2011 — Infrared OD 4 bandpass filters that provide the high transmission and deep rejection necessary to isolate narrow spectral regions for use in a variety of applications have been unveiled by Edmund Optics. They are durable for use in harsh...
Edmund Optics Inc.
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Automated TEM for Nanoanalysis
PEABODY, Mass., July 19, 2011 — A 200-kV transmission electron microscope (TEM) manufactured by JEOL USA Inc. performs high-throughput nanoanalysis for process and quality control of mass-produced semiconductor and materials samples. The multifunction JEM-2800 features...
JEOL USA Inc.
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FLIM and FCS Upgrade Kit
BERLIN, July 15, 2011 — PicoQuant GmbH has extended the compatibility of its upgrade kit for laser scanning microscopes. The kit, which upgrades microscopes for fluorescence lifetime imaging (FLIM) and fluorescence correlation spectroscopy (FCS), now also supports upgrades...
PicoQuant GmbH
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Mounted CO2 Laser Lenses
PROVIDENCE, R.I., July 15, 2011 — Laser Research Optics has introduced a full line of CO2 laser focusing lenses that can be supplied in mounts as complete assemblies for easy lens replacement in Amada Lasers. The mounted focusing lenses are OEM-compatible for use in Amada...
Laser Research Optics
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High-Dynamic-Range Cameras
BARRINGTON, N.J., July 14, 2011 — Edmund Optics has introduced high-dynamic-range cameras that provide high-quality images from the visible to the near-infrared for a variety of applications. They provide 50-fps image capture and feature a dynamic range of 120 dB, which allows...
Edmund Optics Inc.
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Film Thickness Measurement Tool
SAN DIMAS, Calif., July 11, 2011 — For the semiconductor industry, Craic Technologies Inc. has developed the 20/20 XL, a film thickness measurement tool. It is a microspectrophotometer designed to nondestructively spectrally analyze and image microscopic areas of very large samples....
CRAIC Technologies
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NanoRapid Soldering System
GROSS-UMSTADT, Germany, July 8, 2011 — The NanoRapid from nanosystec GmbH is a high-speed selective laser soldering system that is well suited for high-volume production. Its productivity reduces manufacturing costs. Selective laser soldering has numerous advantages for...
nanosystec GmbH
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Europa MHz OPA
HARPENDEN, England, July 7, 2011 — Europa, an optical parametric amplifier (OPA) from Elliot Scientific Ltd., is directly pumped by submillijoule pulses provided by the FemtoSource high-energy oscillators such as the XL 500 and XL 650. The complete package of the FemtoSource...
Elliot Scientific Ltd.
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Laser Scanning Microscopes
ITASCA, Ill., July 6, 2011 — The VK-X series 3-D laser scanning microscopes manufactured by Keyence Corp. of America combine the capabilities of scanning electron microscopes and noncontact roughness gauges with the simplicity of an optical microscope. The systems deliver...
Keyence Corp. of America
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Atomic Force Microscope
Jul 1, 2011 — The Dimension FastScan atomic force microscope (AFM) from Bruker Corp. delivers good imaging speed without sacrificing nanoscale resolution. It produces results in seconds or minutes instead of hours or days. The system performs large-sample...
Bruker Nano Surfaces
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Attenuator for Photodetectors
Jul 1, 2011 — Newport Corp. has introduced an attenuator design implemented for its Series 818 low-power photodetectors. Based on the same optics and clear aperture of the 918D series detectors, it features a clear aperture with the size reduced to 10 mm to help...
MKS/Newport
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Custom Off-Axis Paraboloids
Jul 1, 2011 — Optical Surfaces Ltd. can typically produce off-axis parabolic mirrors up to 600 mm in diameter with surface accuracies to λ/20 peak-to-valley, depending upon off-axis angles. With proprietary polishing techniques, the company can, depending...
Optical Surfaces Ltd.
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Custom Optical Systems
Jul 1, 2011 — Resolve Optics Ltd. designs and manufactures custom optical systems for use in harsh environments. For high-temperature environments, the company has developed optical systems that will operate at up to 950 °C without cooling. For radioactive...
Resolve Optics Ltd.
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Graded-Reflectivity Mirrors
Jul 1, 2011 — A series of graded-reflectivity mirrors from Research Electro-Optics Inc. enables precise spatial shaping of the intensity and phase characteristics of laser beams. In the mirrors, the reflectivity and/or phase effects of the coating vary radially...
Research Electro-Optics Inc. (REO)
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Imaris 7.3 Microscopy Software
ZURICH, Switzerland, July 1, 2011 — Bitplane, part of Andor Technology plc, has released its Imaris 7.3 image processing, analysis and visualization software. New capabilities include novel segmentation functions in ImarisCell, advanced filters in Imaris MeasurementPro and...
Bitplane AG
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