Polytec TopMap Surface Metrology Products
The Polytec TopMap family of surface metrology solutions offers unparalleled flexibility for measurement of flatness, step-height, parallelism, roughness, and more. The unique multi-sensor Pro.Surf+ measures flatness and roughness by combining coherence scanning interferometry and a confocal probe. Recently introduced Micro.View and Micro.View+ are 3D optical profilers for microstructures surface finish and topography analysis. With nm precision and software that is lab or shop-floor ready, our non-contact metrology systems are ready for the most challenging applications.
optical profilerprofilometrysurface finishsurface metrologysurface roughnesswhite light interferometerflatness measurement3D surface profilernon-contact profilercoherent scanning interferometry