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Ruled and Holographic Gratings
Ruled and Holographic Gratings
Optometrics Corp.
  • Type: Component
MicroPL
MicroPL
Edinburgh Instruments Ltd.
  • Type: Equipment
  • Excitation / Emission Range: 360 nm – 850 nm (std)
  • Excitation Modes: Widefield
  • Objective Magnification: from 5× to 100×
ZEISS Optical Gratings
ZEISS Optical Gratings
Carl Zeiss Spectroscopy GmbH
  • Type: Component
  • Groove density: 22 – 3600 l/mm
  • Radius of curvature: plane or 50 – 1000 mm
  • Spectral range: 120 nm – 20 µm
ZEISS Spectrometer Modules
ZEISS Spectrometer Modules
Carl Zeiss Spectroscopy GmbH
  • Type: System
  • Integration time: > 1.1 ms
  • Numerical aperture: 0.22
  • Resolution (FWHM): 3 nm
DeepUV Gratings
DeepUV Gratings
Optometrics Corp.
  • Type: Component
  • Size: 4×4mm - 30×30mm
  • UV Performance Range: 190 - 400 nm
Mini-Chrom Monochromator
Mini-Chrom Monochromator
Optometrics Corp.
  • Type: Equipment
  • f Number: 3.9
  • Focal Length: 74 mm
  • Operating Temperature: -20 °C to +80 °C
Entrance Slits
Entrance Slits
Graticules Optics Ltd.
  • Type: Component
  • Electroplated: >10 µm
Glacier X
Glacier X
m-oem
  • Type: Component
  • Filter Type: LVF (Long)
  • Grating: 700/530
  • Slit Width: 25 µm slit
Quest X
Quest X
m-oem
  • Type: Component
  • Filter Type: LVF (Long)
  • Grating: Ruled, 600/400
  • Slit Width: 25 µm slit
Exemplar Plus
Exemplar Plus
m-oem
  • Type: Component
  • Filter Type: LVF (Long)
  • Grating: Ruled, 300/280
  • Slit Width: 25 µm slit
Exemplar T
Exemplar T
m-oem
  • Type: Component
Fixed Grating Spectrograph
Fixed Grating Spectrograph
HORIBA
  • Type: Equipment
Scanning System
Scanning System
Projectina AG
  • Type: Equipment
ProbePro Mini
ProbePro Mini
Timegate Instruments Ltd.
  • Type: Equipment
  • Diameter: 35 mm
  • Length: 175 mm
Microprobe
Microprobe
Timegate Instruments Ltd.
  • Type: Equipment
SampleCube
SampleCube
Timegate Instruments Ltd.
  • Type: Equipment
VeeMAX III
VeeMAX III
PIKE Technologies Inc.
  • Type: Equipment
10Spec
10Spec
PIKE Technologies Inc.
  • Type: Equipment
Mid-IR IntegratIR
Mid-IR IntegratIR
PIKE Technologies Inc.
  • Type: Equipment
Laboratory Instruments - mills, grinders
Laboratory Instruments - mills, grinders
Fritsch GmbH - Milling and Sizing
  • Type: Equipment
SERS Substrates
SERS Substrates
Amerigo Scientific
  • Type: Component
XperRF
XperRF
Nanobase Inc.
  • Type: System
V/VX2740 Waveform Digitizer
V/VX2740 Waveform Digitizer
CAEN Spa
  • Type: Equipment
  • Bin Resolution: 16 bit
  • ENOB: 11.7 (Typ)
  • FPGA: Open
XperRAM S Series
XperRAM S Series
Nanobase Inc.
  • Type: System
  • Active Pixels (detector): 2000 × 256 pixels
  • Raman Peak Efficiency: ≥ 90%
  • Scanning Positioning Accuracy: ≤ 1µm
IRis-Core
IRis-Core
IRsweep
  • Type: System
  • Center Wave Numbers: 2200 cm-1 (4.5µm) - 900 cm-1 (11.1 µm)
  • Optical Power: 20 mW - 300 mW
  • Spectral Resolution: <10 MHz (0.0003 cm-1)
IRcell-S - Multipass Absorption Cell
IRcell-S - Multipass Absorption Cell
IRsweep
  • Type: Equipment
  • Internal Volume: 31 ml
  • Mirror Design: Single Piece
  • Path Length: 4.03 m
Portable Raman System
Portable Raman System
Technospex Pte. Ltd.
  • Type: System
SphereSpectro 150H
SphereSpectro 150H
Gigahertz-Optik Inc.
  • Type: System
ATR Fiber Probe for hazardous environments
ATR Fiber Probe for hazardous environments
art photonics GmbH
  • Type: Component
  • Industrial application: 12 mm diam shaft
  • Lab application: 6 m diam shaft
Reflection & Fluorescence Fiber Optic Probes
Reflection & Fluorescence Fiber Optic Probes
art photonics GmbH
  • Type: Equipment
  • Operating Temperature: -70 °C to +200 °C
  • Pressure: 10 Bar
  • Wavelength Range (UV/VIS): 190-1300 nm
ATR Probes for FTIR Process Spectroscopy
ATR Probes for FTIR Process Spectroscopy
art photonics GmbH
  • Type: Equipment
  • 1.1 to 17: µ
  • -150 to +250: °C
  • 6.3 mm to 12 mm: DIA
microDXP
microDXP
XIA LLC
  • Type: Component
  • Dimensions: 54W×86L×5H
Mercury
Mercury
XIA LLC
  • Type: Component
  • Meas. Type: Fluorescence
DWS RheoLab
DWS RheoLab
LS Instruments AG
  • Type: Equipment
  • Complex Modulus G*: 1-50 kPa
  • Frequency: 0.1 Hz-10 MHz
  • Sample Volume: 150-1500 uL
NanoLab
NanoLab
LS Instruments AG
  • Type: Equipment
  • Excitation Wavelength: 685 nm
  • Sample Volume: 50-2000 uL
  • Scattering Angle: 90°
XLNCE SMX-BEN XRF Analyzer
XLNCE SMX-BEN XRF Analyzer
EDAX Inc., Corporate Headquarters
  • Type: Equipment
  • Meas. Technique: Fluorescence
Orbis Micro-XRF Elemental Analyzer
Orbis Micro-XRF Elemental Analyzer
EDAX Inc., Corporate Headquarters
  • Type: Equipment
SimpleTau
SimpleTau
Becker & Hickl GmbH
  • Type: System
WaveCapture FBG Analyzer System
WaveCapture FBG Analyzer System
BaySpec Inc.
  • Type: System
  • Channel Number: 1 or 4
  • Frequency Response Time: up to 5 kHz
  • Readout Resolution: 1 pm
Other Spectroscopy Products Products


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