Request InfoNanometer Technologies Inc.The AFiS systems (AfiS Sr., AfiS Jr. Plus, AfiS Jr.) are superior scratch detection systems that fully automate your visual inspection of connectors. AFiS can quickly and accurately -- regardless of fiber orientation -- detect defects smaller than a single micron on fiber ends. Nanometer Technologies' proprietary inspection software detects defects by performing a contrast-based analysis, or mapping, of a captured image of the fiber end, or surface of the connector, providing a robust and sophisticated graphical user interface. 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