Request InfoTAGARNOHORSENS, Denmark, Aug. 22, 2019 — The DXF Overlay application from TAGARNO allows microscope users to identify miniature printed circuit board (PCB) components during quality control processes. A search feature enables the operator to quickly identify components and spot deviations from a golden sample. Users can import DXF files to a digital microscope, where the file will appear as an overlay. The overlay will also follow the magnification levels of the microscope, making it easy to perform visual inspection at any magnification level.See full productRelated content from Photonics MediaPRODUCTSVision Spectra Autumn 2023 IssueSurface Inspection SystemThe ZEISS ABIS III is designed for reliable and early inspection of the entire component surface, within cycle time. 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