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high-resolution imaging News
Camera System Combines Wide Field of View with High-Res Capture
TOKYO, May 21, 2021 — A hybrid camera system built by researchers at Shibaura Institute of Technology (SIT) combines wide-angle target monitoring with high-resolution image capture. The system detects indistinct target regions during omnidirectional viewing, and then uses pan-tilt cameras to capture a high-resolution image of the target. To make the system more efficient, the researchers developed an algorithm for reducing the number of complementary shots required. The combination of 360° monitoring with
Zeiss Marks CrossBeam’s Anniversary
Feb 1, 2012 — Carl Zeiss Microscopy recently celebrated the 10th anniversary of its CrossBeam FIB-SEM (focused ion beam-scanning electron microscope) technology. The ceremony was held at the Center for Composite Materials at the University of Delaware, which has...
Zeiss Marks CrossBeam’s 10th Anniversary
PEABODY, Mass., Nov. 30, 2011 — Carl Zeiss Microscopy, a Carl Zeiss Group company, recently celebrated the 10th anniversary of its CrossBeam FIB-SEM (focused ion beam-scanning electron microscope) technology. The ceremony was held at the Center for Composite Materials at the...
Laser-treated Parchment Creates Microfluidic Device
WEST LAFAYETTE, Ind., Jan. 26, 2011 — Using lasers to create patterns on common parchment paper, researchers are now able to make "microfluidic" devices for rapid medical diagnostics and chemical analysis. The innovation represents a way to enhance commercially available diagnostic...
Carl Zeiss Ships First PROVE System
JENA, Germany, and MAKUHARI, Japan, Sept. 14, 2010 — Carl Zeiss recently reported the delivery of the first PROVE Registration and Overlay Metrology System for photomasks to NuFlare Technology, the world leading supplier of mask writers based on electron-beam technology. “We are pleased to...
Ultrafast Laser Enables New Technologies
BOULDER, Colo., Feb. 25, 2010 – In what is being touted as a major breakthrough, University of Colorado at Boulder physics professors, Margaret Murnane and Henry Kapteyn have built a tabletop X-ray laser for supe...
Metrology Research
Sep 1, 2009 — FEI Co. of Hillsboro, Ore., a provider of atomic-scale imaging and analysis systems, has joined the Advanced Metrology Development Program at the College of Nanoscale Science and Engineering at the University at Albany-State University of New York....
Edmund Optics Releases Fall Catalog
Sep 11, 2007 — Edmund Optics (EO) has released its fall 2007 catalog, featuring more than 1500 new products including off-the-shelf edge-blackened optics, Techspec near-infrared linear polarizers, Techspec corner-cube retroreflectors with BBAR coating, Techspec...
EO Partners Award Goes to Epic Vision
Jul 6, 2007 — Edmund Optics (EO) presented its first annual EO/VIP award to Epic Vision Solutions, a St. Louis, Mo., provider of machine vision and inspection technology for quality control in manufacturing, at the International Robots and Vision Show and...
EO Offers Online Video Lens Selector
Jul 2, 2007 — Edmund Optics (EO) offers an online video lens selector at www.edmundoptics.com/selectionguide that features ratings by flexibility, working distance, image quality, depth of field, integration features and price. The selector enables searches for...
High-Res Scan Reveals Cartilage in 3-D
ATLANTA, Dec. 5, 2006 -- By combining two existing technologies, researchers have created a new noninvasive, high-resolution way to image cartilage. The technique shows promise in research on the progression and treatment of osteoarthritis, a common degenerative...
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April 2024
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