Keithley to Host Free Webinar on Characterization
CLEVELAND, Ohio, April 26, 2010 — Keithley Instruments Inc., an advanced electrical test instruments and systems provider, announced it will broadcast a free, web-based seminar titled, “Fundamentals of Ultrafast I-V Device Characterization,” on April 29, 2010.
The one-hour presentation will examine the importance of ultrafast current-voltage (I-V) characterization across a broad spectrum of device and process technologies. Common applications include non-volatile memory devices (NVM), like Flash and phase...