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semiconductor wafers News
Semiconductor etching gets easier
CHAMPAIGN, Ill. – A method that chemically etches patterned arrays in gallium arsenide will make high-end optoelectronic devices easier to manufacture. Developed by a team led by Xiuling Li of the University of Illinois, the technique will enable faster, less...
Semiconductors Etch Easier with New Method
CHAMPAIGN, Ill., Jan. 4, 2012 — A method that chemically etches patterned arrays in the semiconductor gallium arsenide will make high-end optoelectronic devices easier to create. A team of researchers led by Xiuling Li, an electrical and computer engineering professor at the...
Tiny Optics Continue to Roll Forward
Jul 13, 2011 — Individually micro-optics are a few millimeters in diameter at best, but together these tiny lenses comprise a powerful link to future technologies that will affect everything from advanced computers to human health.
IQE CEO Elected EPIC President
PARIS, April 5, 2011 — The European Photonics Industry Consortium (EPIC) has announced the election of Dr. Drew Nelson, chief executive officer at IQE of Cardiff, UK, as its president. He will begin his term today, presiding over the annual general assembly of EPIC. ...
Tamar Garners NSF Funding
Jun 1, 2008 — Tamar Technology of Newbury Park, Calif., has been awarded a Phase II grant from the National Science Foundation of Arlington, Va., to continue researching a technology for measuring the thickness of semiconductor wafers and the depth of deep and...
Daily News Briefs
Aug 25, 2004 — Color Kinetics Inc., a Boston maker of digital lighting systems and technologies, said it has been issued a patent relating to a "miniaturized, integrated, intelligent solid-state string light in which individual LED nodes in a string configuration...
Semiconductor Inspection Moves to Deep-UV Imaging
Jul 1, 2004 — Fueled by the ever-decreasing size of features on semiconductor wafers, the semiconductor inspection industry continues to focus on shorter-wavelength light (Figure 1). Increasingly, the manufacturers of wafer and reticle (photomask) inspection...
Reflectivity Yields Fresnel Lenses
Jan 1, 2003 — Continuing their work with photoinduced reflectivity, scientists at W.W. Hansen Experimental Physics Laboratory at Stanford University in California have produced transient diffractive optical elements in semiconductor wafers by optical stimulation....
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April 2024
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