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Microscopy News
Laser Microscopy Technique Reduces Sample Damage
Apr 1, 1997 — SAN JOSE, Calif. -- Breakthroughs in a relatively new laser-based microscopy technique have produced high-resolution images of living specimens with relatively little photodamage. The less harmful nature of the infrared light it uses makes the...
Near-Field Scanning Optical Microscopy Measures Diode Beam Properties
Apr 1, 1997 — Astigmatism is a problem for laser diodes, and even after applying correctional optics, residual astigmatism (a few microns) remains because of laser-to-laser variations. In addition, temperature and pump current variations may affect astigmatism...
Fiber Bundle Grows Microscopy Tools
Mar 1, 1997 — Near-field optical techniques employ a single nanometer-size aperture that scans across a region of interest. Increasing the number of apertures expands the area that can be scanned at one time. Tufts University researchers have generated thousands...
Positioning Device Helps Man Understand Earth's Past
Mar 1, 1997 — A network of cliff dwellings cut by prehistoric Amerindians and then abandoned without so much as a how-do-you-do confounded archaeologists at the turn of the century. But one man had an idea: Maybe climatic change had something to do with the...
Photonics Projects Win $13.5 Million in US Funding
Feb 1, 1997 — ARLINGTON, Va. -- Eighteen photonics projects won $13.5 million in National Science Foundation awards.The winners were selected from among 76 proposals related to how light interacts with matter. Following are the winning projects, institutions, and...
Polarimeter Eyed for Faster Optical Analysis
Feb 1, 1997 — A new fast-imaging polarimeter under development at Cambridge Research & Instrumentation Inc. will enable users to measure the optical anisotropy of specimens in less than 1 s. The Cambridge, Mass.-based company received a Small Business...
X-Ray Microcalorimeter Developed for Improved Materials Analysis
Feb 1, 1997 — An x-ray microcalorimeter developed by the National Institute of Standards and Technology could improve materials analysis in the semiconductor industry. The device, compatible with commercially available scanning electron microscopes, can achieve...
Laser Dissection Aids Pathologists, Patients
Jan 1, 1997 — WASHINGTON -- Researchers battling cancer and other debilitating diseases will soon have a new weapon in their arsenal. A technique developed at the National Institutes of Health (NIH) will enable pathologists to assess the molecular behavior of...
Microscopy: Old Technology Gets New Life
Jan 1, 1997 — Over the last 150 years of microscope development, an impressive array of innovations has come to light. Today’s seemingly commonplace imaging techniques include phase contrast, which won a Nobel prize for the Zeiss developer Frits Zernicke when...
Uniphase to Sell Ultrapointe Subsidiary
Jan 1, 1997 — SAN JOSE, Calif. -- To concentrate its resources on the telecommunications industry, Uniphase Corp. has signed a letter of intent to sell its Ultrapointe subsidiary to Tencor Instruments, a leader in semiconductor inspection systems.An...
Researchers Count on Buckyballs to Create Tiny 'Abacus' for Processing
Dec 1, 1996 — Scientists at IBM Zurich in Switzerland have used a scanning tunneling microscope probe to reposition C-60 molecules, or "buckyballs," on a copper substrate, producing a room-temperature device that can store and manipulate numbers at a single...
Smooth Plasma Would Improve X-Ray Lasers
LIVERMORE, Calif. — Smoothing the plasma from an x-ray laser amplifier could improve the device's efficiency by up to 50 percent, according to researchers at the Lawrence Livermore National Laboratory. The research team, led by Robert Cauble and Luiz Da Silva, made...
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April 2024
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