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Test & Measurement Products
PULSE MEASUREMENT
Feb 1, 1999 — Elliot Scientific Ltd. has introduced its Timewarp E-750 autocorrelator for pulse measurement of mode-locked Ti:sapphire lasers with pulse widths between 40 and 500 fs. It is designed to generate a measurable autocorrelation without the need for nonlinear crystals, reducing alignment and setup time as well as the cost. The compact instrument is based on an equal-path interferometer design and two-photon autocorrelation on a GaAsP photodiode. The signal is displayed on a standard oscilloscope.
Elliot Scientific Ltd.
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MEASUREMENT SOFTWARE
Sep 1, 1998 — National Instruments introduces a new version of its Measure software for direct data acquisition and instrument control using Microsoft Excel on Windows 95/NT. The software features dialogs for setting up acquisition and control operations,...
National Instruments Corp.
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NEAR-IR ANALYZER
Jul 1, 1998 — Analytical Spectral Devices Inc. has released the FieldSpec Chem, a portable near-infrared analyzer designed for quality assurance and control applications in a laboratory or production setting. Available in two models, the device has a total...
ASD Inc.
ENERGY METER
Jun 1, 1998 — The F100A-HE power/energy meter from Ophir Optronics Inc. features an aperture of f25 mm and withstands up to 20 times the power and energy density of traditional volume absorbers. The instrument is spectrally flat over most of the range from 0.2 to...
MKS Ophir, Light & Measurement
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MEASUREMENT STATION
Jun 1, 1998 — Bentham Instruments Ltd. has introduced a large-sample measurement station that employs long-focal- length optics. The company says the device's measurement compartment is as large as some complete spectrophotometers; it can accommodate a 36 3 22 3...
Bentham Instruments Ltd.
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METROLOGY TOOL
Jun 1, 1998 — The FilmTek 2000 is based on Scientific Computing International's new thin-film metrology technology. It combines the ease of use of a fiber optic-based spectrophotometer with material modeling software to provide a reliable tool for simultaneous...
Scientific Computing International
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SPECTROPHOTOMETERS
Jun 1, 1998 — The Shimadzu FTIR-8300 and FTIR-8700 spectrophotometers feature a patented computer-controlled optical alignment system with intrascan correction from 5 to 10,000 Hz. The low-maintenance, frictionless mirror positioning system is immune to tilt and...
Shimadzu Scientific Instruments Inc.
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GONIOMETERS
May 1, 1998 — A line of goniometers from Opto-Sigma Corp. offers rotation of an object or sample on a point in space without obscuring the incident beam. They simplify adjustment without the need for bulky mounts within the area of the element itself. One or two...
OptoSigma Corp.
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NIR ANALYZER
May 1, 1998 — The FieldSpec Chem from Analytical Spectral Devices Inc. is a portable near-IR analyzer designed for quality control applications in the lab or on a production line. The device covers the spectral range from 1000 to 2500 nm and can measure...
ASD Inc.
RADIATION MEASUREMENT
May 1, 1998 — Solar Light Co.'s Microtops II handheld meter calculates total column ozone thickness by measuring direct solar UV radiation at three wavelengths in the UVB range. It also can be configured to measure total water vapor and aerosol optical thickness....
Solar Light Co. LLC
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VARIABLE ATTENUATOR
May 1, 1998 — Santec Corp. has announced its OVA-20M and OVA-30M miniature optical variable attenuators. They can be built into a variety of optical communication and measurement systems including WDM applications. They employ neutral density filters with high...
Santec USA Corp.
DLC ANALYZER
Apr 1, 1998 — Renishaw plc has developed a quality control system that uses Raman spectroscopy to determine diamond-like-carbon film parameters such as film thickness, hydrogen content and chemical bonding of the carbon. The measurements are performed with no...
Renishaw PLC, Spectroscopy Products Div.
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TIME MEASUREMENT
Apr 1, 1998 — Berkeley Nucleonics Corp. has unveiled an eight-channel time-to-digital converter module. The B980 module is packaged as a single width, 6U VME module with less than 50-ps resolution and 70-ps jitter. It has two modes of operation. In the time...
Berkeley Nucleonics Corporation
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LAMP MEASUREMENT
Mar 1, 1998 — The BLS1000 and BLS1800 lamp measurement systems from Bentham Instruments Ltd. are equipped with 1.0- and 1.8-m-diameter integrating spheres, respectively. The systems are available with a variety of lamp holders for miniature incandescent, compact...
Bentham Instruments Ltd.
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LASER VIBROMETER
Mar 1, 1998 — MetroLaser Inc.'s VibroMet is a laser vibrometer system designed for noncontact, single-point vibration measurements. Based on the company's optical and electronic configuration, the compact device can detect vibration amplitudes as low as 0.02 nm...
MetroLaser Inc.
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SURFACE MEASUREMENT
Mar 1, 1998 — Fisba Optik, represented by Breault Research Organization Inc., offers its Twyman-Green phase-shifting interferometers. The Fisba µPhase MicroInterferometer, with a base unit the size of a matchbox, has a modular design for easy adaptation to the...
Breault Research Organization Inc.
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VME COMPUTERS
Mar 1, 1998 — National Instruments has released its family of 6U, Intel Pentium-based, embedded VME computers that are compatible with the leading test and measurement software. The VMEpc-600 series includes the VMEpc-650/233, based on the 233-MHz Pentium MMX...
National Instruments Corp.
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PHOTON COUNTING
Feb 1, 1998 — The Time Harp 100 single-photon counting board from PicoQuant GmbH is a complete system for time-resolved measurements on a single PC card. The solid-state design cuts costs, improves reliability and simplifies calibration. The circuit allows...
PicoQuant GmbH
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DIODE MEASUREMENT
Jan 1, 1998 — Gradient Lens Corp.'s LARS/200 diode laser measurement system will be made and marketed by LaserMax Inc. as Nano-Trak. This self-contained system, which eliminates the need for separate lasers, interferometers, receivers and electronics modules, can...
Gradient Lens Corp.
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DOPPLER VELOCITY INTERFEROMETER
Jan 1, 1998 — The DVI 99 noncontact velocity recording system from Martin, Froeschner & Associates detects spontaneous changes in the frequency of light reflected from a moving surface. This turnkey system, which is housed in a 3-in. rack-mounted chassis, is...
Martin, Froeschner & Associates
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OPTICAL POWER METER
Jan 1, 1998 — EXFO E.O. Engineering Inc. has developed an optical power meter, the PM-1100, with a dynamic range of 110 dB. The device allows the user to store up to 512 readings and up to 1024 data points. Standard GPIB and RS-232 interfaces are supplied along...
EXFO Inc.
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FO LIGHT SOURCE
Dec 1, 1997 — The ALS-06 offered by Ancal Inc. is a fiber optic light source designed to provide reliable illumination for spectroscopic and radiometry measurements. The system includes a high-intensity quartz halogen lamp, a soft start circuit, a regulated power...
Ancal Inc.
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INTERFEROMETER
Dec 1, 1997 — Blue Sky Research's Laser Wave Analyzer provides users with information about the quality of a laser beam. The dual shearing interferometer system displays wavefront phase and aberrations, beam intensity and profile, and far-field characteristics....
Blue Sky Research
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POWER METER
Dec 1, 1997 — A new handheld laser power meter is available from Coherent. The LaserCheck is microprocessor-controlled, with wavelength correction, autoranging, and sample and hold functions. Its rugged, ergonomic design allows single-button power measurements in...
Coherent Inc.
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FLATNESS MEASUREMENT
Sep 1, 1997 — Lapmaster International has issued a 36 3 24-in. wall chart that details the principles of using light bands and how to interpret them for measuring flatness in conjunction with monochromatic light. The use and maintenance of optical flats, and...
Lapmaster Wolters Ltd.
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April 2024
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