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Test & Measurement Products
LASER DIODE PARAMETER EXTRACTOR
Sep 1, 1997 — Photon Design is offering LASFIT, a laser diode parameter extractor program designed to extract as much data as possible from simple experimental measurements on a distributed feedback (DFB) laser. After the user supplies one measurement of a laser's spectrum just below threshold, the program gives estimates for up to 14 parameters including facet reflectivities, facet phases and refractive index coefficients. The extracted parameters then can be fed back into a CAD model for further device...
Photon Design
MEASUREMENT PROBE
Sep 1, 1997 — Star Tech Instruments Inc. has developed the HT-500C probe for measuring the uniformity of high-power lamps at the wafer plane. This instrument was designed to operate at temperatures up to 500 °C without loss of accuracy. Other features include 5%...
Star Tech Instruments Inc.
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ROUGHNESS MEASUREMENT
Sep 1, 1997 — A module for the analySIS image analysis and processing software package from Synoptics Ltd. calculates the fractal dimension of a particle edge, giving a quantitative description of the particle structure or shape. This allows subjective...
Synoptics Ltd.
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PULSED RANGEFINDER
Jul 1, 1997 — A pulsed laser rangefinder with a glass-fiber-coupled remote optical head and split optics design is offered by Riegl Laser Measurement Systems. The company's LD90-3100 EHS-GF and LD90-3300 EHS-GF series of noncontact pulsed laser rangefinders are...
Riegl Laser Measurement Systems GmbH
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SPECTROPHOTOMETERS
Jun 1, 1997 — Spectrophotometric instruments that include a halogen visible light source and a UV-1 deuterium light source are available from Analytical Instrument Systems Inc. Models DLK-1000 VIS and DLK-1000 UV have wavelength ranges from the VIS to the UV. The...
Analytical Instrument Systems Inc.
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LASER RANGEFINDER
Apr 1, 1997 — Riegl USA is offering the LD 90-3-GF series of pulsed laser rangefinders for low-level altimetry applications. Providing fast and accurate ground-to-aircraft distance measurements, these devices can measure from 3 to 5280 ft with accuracies as high...
Riegl USA Inc.
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OPTICAL METROLOGY TOOL
Apr 1, 1997 — WaveFront Sciences Inc. has introduced the Complete Light Analysis System - 2D, which provides quantitative measurements of both the intensity and phase of any optical source. This vibration-insensitive optical metrology tool is a low-cost baseline...
AMO WaveFront Sciences LLC
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SPECTRUM ANALYZER
Apr 1, 1997 — EXFO E.O. Engineering Inc. has introduced the IQ-5200 Optical Spectrum Analyzer series. Designed for wavelength division multiplexing system design, qualification and monitoring, these devices can also be used to qualify and test optical components....
EXFO Inc.
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AUTOMATIC CIRCLE POLARIMETERS
Mar 1, 1997 — Topac Inc. Instrumentation has introduced the Polartronic series of automatic circle polarimeters from Schmidt and Haensch. Designed to measure the optical activity and concentration of optically active solutes, these microprocessor-controlled...
Topac Inc.
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CIRCULAR MEASUREMENT
Feb 1, 1997 — Precitech Inc. has added two large-capacity circular form measurement systems to its line of low-cost circular geometry gauges. Utilizing an overhead bridge design, the Model FMS 8270 can accommodate workpieces up to 1000 lb with dimensions up to 36...
AMETEK Precitech Inc.
PORTABLE REFLECTOMETER
Feb 1, 1997 — Dyn-Optics has developed the Model 262 portable reflectometer to measure the reflectance of flat or curved surfaces such as car light reflectors and the finish on soft-drink cans. The device is operated by touching the fiber optic probe to the...
Dyn-Optics
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X-RAY MEASUREMENT
Feb 1, 1997 — The OPTEK Innervision x-ray inspection and measurement systems from Operations Technology Inc. are suitable for multilayer printed circuit board applications. They allow the user to view and measure metal layers inside laminated or molded materials....
Operations Technology Inc. (OPTEK)
X-Y STAGES FOR METROLOGY
Feb 1, 1997 — NUTEC Components Inc. has introduced the Metrostage series of precision X-Y stages for applications in metrology. The cross-roller stages feature an 8 3 8-in. travel range and 0.25-µm-resolution linear glass scale encoders with 1-µm/in. accuracy. A...
Nutec Components Inc.
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DATA ACQUISITION
Jan 1, 1997 — The OMB-TEMPBOOK-66 from Omega Engineering is a data acquisition system that adds voltage- and thermocouple-measurement capability to laptop PCs. It can also provide an alternative to plug-in boards for desktop systems. An enhanced parallel port...
Omega Engineering Inc.
OPTICAL FIBER ANALYSIS
Jan 1, 1997 — Photon Kinetics Inc. and York Technology Ltd. have improved the software and hardware capabilities of the Model 2600 Preform Analyzer. Improved preform measurement throughput and expanded flexibility in measurement reporting are the result of a...
Photon Kinetics Inc.
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REAL-TIME MEASUREMENT
Jan 1, 1997 — Enabling measurements of objects in real-time video, the Model 307 Video Caliper from Colorado Video Inc. features an LCD display that indicates the distance between two cursors that are user-positioned around a selected object. The cursor...
Colorado Video Inc.
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VIDEO MEASUREMENT
Jan 1, 1997 — The OPTEK V-Series of video inspection and measurement systems is available from Operations Technology Inc. The devices deliver transport speeds up to 12 in./s, typical throughput rates of one feature measured per second, and measurement accuracy of...
Operations Technology Inc. (OPTEK)
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April 2024
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