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Test & Measurement Products
InGaAs Cameras/Detectors
SAN JOSE, Calif., May 2, 2011 — BaySpec Inc. has announced Nunavut, an InGaAs camera and detector line of products that enable low-light spectroscopy in the near-infrared region. Deep cooling of the detector arrays allows for better low-light spectral measurements, offering an improvement of >250 times in signal-to-noise performance. The devices are available in 900- to 1700-, 1100- to 2200 and 1250- to 2500-nm linear array configurations. They perform real-time spectral data acquisition and offer long-lifetime...
BaySpec Inc.
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Concave Grating Spectrometers
May 1, 2011 — The Black-Comet-HR concave grating spectrometers manufactured by StellarNet are designed for high-resolution applications. Available for measurements in the UV (200 to 600 nm) and visible (380 to 750 nm) ranges, the instruments achieve resolution of...
StellarNet Inc.
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Dynamic Profiler
May 1, 2011 — For 3-D measurement of surface roughness on large polished optics and optical-quality surfaces, despite vibration or turbulence, 4D Technology Corp. has released the NanoCam Sq dynamic profiler. The instrument replaces the slow, messy replication...
4D Technology Corporation
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Glass Trace Evidence
May 1, 2011 — Craic Technologies Inc. has collaborated with Laboratory Imaging sro to introduce the rIQ (refractive index quantification) system for analyzing glass trace evidence. It combines image analysis software, an advanced optical design and electronics to...
CRAIC Technologies
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Millimeter Wave Measurement
May 1, 2011 — SA Photonics has developed a millimeter wave measurement system (MWMS), a high-power measurement and calibration unit that tests and calibrates millimeter wave sources and instrument test ranges. It records power densities in frequencies ranging...
Vision Products LLC
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Miniature Spectrometers
May 1, 2011 — B&W Tek Inc. has announced the updated Quest series miniature fiber optic spectrometers that now feature an ultra low thermal drift spectrum and a faster readout speed of >2 MHz. The devices are available with an optional RS-232 communication...
B&W Tek LLC
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NIR Photon Counter
May 1, 2011 — Available from ID Quantique SA, the id210 advanced system for single-photon detection is suitable for detection at the telecommunications wavelengths of 1310 and 1550 nm. Its performance in high-speed gating at internal or external frequencies up to...
ID Quantique
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OEM Spectrometers
May 1, 2011 — Ibsen Photonics has launched the Rock VIS-NIR and XNIR (extended NIR) line of modular, industrial-grade, robust OEM spectrometers for the 550- to 1050-nm and 1175- to 2185-nm-wavelength ranges, respectively. They deliver high optical throughput...
Ibsen Photonics A/S
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Thermal Imager
May 1, 2011 — Optris GmbH has unveiled the second generation of its PI thermal imager. The stationary camera is now equipped with a new detector to improve measurement accuracy. The new generation of detectors enables measurement of small objects on a micrometer...
Optris Infrared Sensing LLC
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Ultrafast TOF Detectors
May 1, 2011 — Photonis USA has added a 40-mm size to its Gen2 ultrafast time-of-flight (TOF) detector product line, which now can support input areas from 18 to 40 mm and allows a TOF mass spectrometer to increase its mass resolution simply by replacing the...
Photonis Technologies
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Vibration Isolation Baseplate
May 1, 2011 — A tabletop vibration isolation platform designed for sensitive instrumentation and microscopes has been introduced by Newport Corp. The VIBe vibration isolation baseplate is a compact and easy-to-use platform that reduces vibrations that can disturb...
MKS/Newport
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Integrating Sphere Detectors
IRVINE, Calif., April 29, 2011 — Newport Corp. has announced the newly enhanced calibrated integrating sphere detectors. Suitable for measurement of output light power of high-power light sources, the spheres optimize the measurement geometry for laser beams and other light...
MKS/Newport
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IR Laser Spectrum Analyzer
Apr 29, 2011 — The model 721 provides the most complete spectral characterization of CW and high-repetition rate pulsed lasers out to 12 um. Wavelength accuracy is as high as +/- 0.2 ppm and spectral resolution is as high as 2 GHz.
Bristol Instruments Inc.
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In-Line NIR Process Analyzer
STOCKHOLM, Sweden, April 26, 2011 — Perten Instruments’ DA 7300 in-line near-infrared process analyzer has been upgraded and can now be seamlessly integrated into industrial environments using OPC and RS-Linx. Used for process optimization in the agricultural industry, it...
Perten Instruments AB
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ESM Imaging Technique
SANTA BARBARA, Calif., April 25, 2011 — Asylum Research's electrochemical strain microscopy (ESM) imaging technique for its Cypher and MFP-3D atomic force microscopes was developed with Oak Ridge National Laboratory. This scanning probe microscopy technique can probe electrochemical...
Oxford Instruments Asylum Research
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Laser Wavelength Meters
Apr 25, 2011 — The model 621 measures laser wavelength to an accuracy as high as ±0.0001nm. Continuous calibration using a built-in wavelength standard ensures the reliable accuracy that is needed for the most demanding applications. Operation from 375nm to...
Bristol Instruments Inc.
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MicronSensIR Detector/Emitter
PALATINE, Ill., April 25, 2011 — Lumex has launched the MicronSensIR family of infrared detectors and emitters. The lead selenide (PbSe) and lead sulfide (PbS) detectors are available in single-element and multielement formats and provide sensitivity of 1.5E10 Jones across the 1-...
Lumex
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MICI Piezo Actuators
JENA, Germany, April 22, 2011 — Piezosystem Jena is offering the MICI series piezo actuators for fine adjustment in conjunction with manual course positioning stages. MICIs are often used in combination with micrometer screws and provide nanometer-scale fine adjustment on top and...
piezosystem jena GmbH
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High-Precision Vacuum Stages
BURLINGTON, Mass., April 21, 2011 — Steinmeyer Inc. offers a range of precision stages suitable for ultrahigh-vacuum applications. The model MT105-LM-HV is one example. Shown is a compact two-axis (X-Z) version with a travel range choice of 30 or 50 mm. Positioning accuracy is 3...
Steinmeyer Inc.
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Nano-F3D Nanopositioner
MADISON, Wis., April 21, 2011 — Mad City Labs Inc. has introduced the Nano-F3D lens nanopositioning system, designed to position an objective lens in three dimensions with subnanometer accuracy and repeatability. With a travel range of 100 µm in each axis, the...
Mad City Labs Inc.
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Piezo Scanning Stage
JENA, Germany, April 20, 2011 — Piezosystem jena GmbH is offering the PXY AP low-profile flat and ultrafast piezo scanning stage. With its large clearance aperture, it enables the installation of diverse sample holders and other fixtures. For accurate scanning applications,...
piezosystem jena GmbH
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Mirror Mount
IRVINE, Calif., April 19, 2011 — Newport Corp. has launched the CONEX-AG-M100D, a remote-controllable, piezo-motor-driven mirror mount that combines the high angular position sensitivity of the Agilis piezo-motor direct-drive technology with exact position information from a...
MKS/Newport
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Positioning Platform
WESTBOROUGH, Mass., April 14, 2011 — The Airglide LED wafer system from Dover is now available in a wide-base version for additional stiffness and support for payloads up to 50 kg, over a travel range of up to 1 m. Combining industry-leading straightness, accuracy and velocity...
Dover Motion
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Four-Axis Alignment Gage
PEABODY, Mass., April 11, 2011 — A new four-axis microgage receiver made by Pinpoint Laser Systems Inc. provides information for evaluating and correcting machinery alignment problems. The 4-D Microgage Receiver measures two linear axes (X and Y) and two angular components...
Pinpoint Laser Systems
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High-Power Test Meter
CLEVELAND, April 11, 2011 — Keithley Instruments Inc. has designed its high-power Model 2651A System SourceMeter for characterizing high-power electronics. The instrument provides the widest current range available in the industry, according to the company. This is...
Keithley Instruments Inc.
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