Sensors & Detectors

MagND™ stackable magnetic ND filters – store spare filters on back of camera; 12-bit ADC, on-board microprocessor; window-free sensors for no fringing; global shutter, optical/TTL trigger; isolated pulse triggering and parallel capture; field-replaceable image sensors; M² option – beam propagation analysis, divergence, focus; new line laser and large beam profiling systems available.

MagND™ stackable magnetic ND filters – store spare filters on back of camera; 12-bit ADC, on-board microprocessor; window-free sensors for no fringing; global shutter, optical/TTL trigger; isolated pulse triggering and parallel capture; field-replaceable image sensors; M² option – beam propagation analysis, divergence, focus; new line laser and large beam profiling systems available.

Port-powered USB 2.0; flexible 3 m cable, no power brick; 0.1 µm sampling and resolution; linear & log X-Y profiles, centroid; profile zoom & slit width compensation; economical and accurate; M² option – beam propagation analysis, divergence, focus.

Port-powered USB 2.0; flexible 3 m cable, no power brick; 0.1 µm sampling and resolution; linear & log X-Y profiles, centroid; profile zoom & slit width compensation; economical and accurate; M² option – beam propagation analysis, divergence, focus.

HyperCal™ – Dynamic noise and baseline correction software; port-powered USB 2.0; flexible 3 m cable, no power brick; 10-bit ADC, 4 MB image buffer & on-board microprocessor; Window-free sensors standard for no fringing; 25,000:1 electronic auto-shutter, 40 µs to 1000 ms; field-replaceable image sensors; M² option – beam propagation analysis, divergence, focus.

Multiple plane spacing options available. Please consult before choosing plane spacing. Beam diameters 5 µm to 4 mm, to 2 µm in Knife Edge mode*, 0.1 µm sampling and resolution Linear & log X-Y profiles, centroid Profile zoom & slit width compensation, Real-time multiple Z plane scanning slit system, Real-time XYZ profiles, Focus position, Real-time M², Divergence, Collimation, Alignment

Port-powered USB 2.0; 0.1 µm sampling and resolution, Linear and log X-Y profiles, centroid Profile zoom & slit width compensation; Economical and accurate; M² option – beam propagation analysis, divergence, focus; LensPlate2™ option for re-imaging waveguides and fiber ends; Development, production, field service;CW; Pulsed lasers, Φ µm ≥ [500/(PRR in kHz)];M² measurement with available M2DU stage

VOx microbolometer, 30 FPS update rate (7.5 FPS for export) Integrated shutter for automated NUC 14-bit ADC, 14 ms time constant – Pulsed lasers with PRR = 1 kHz appear as CW, No chopper/TEC, Parallel capture on multiple cameras M² measurements, MWIR/FIR/CO₂ laser profiling, Field servicing of MWIR/FIR/CO₂ lasers and laser-based systems, Optical assembly&instrument alignment, Beam wander and logging

The BeamPeek™ system allows simultaneous beam profiling, focal spot size and position, and power measurement of Additive Manufacturing (AM) lasers. It tracks how those parameters change with time to assist in the maintenance of quality and repeatability of the manufactured parts.

Integrated for Industrial Production Environments Measures all the critical laser beam parameters of the focused beam up to 10 kW power (up to 30 kW on request), including: Waist (focus spot) width and location, Focal shift, Centroid, M2 or K, Divergence, Beam parameter product, Rayleigh length, and more.